Parametric X-Ray Radiation Observed in Diamond at Low Electron Energies

Freudenberger, J.; Gavrikov, V. B.; Galemann, M.; Genz, H.; Groening, L.; Morokhovskii, V. L.; Morokhovskii, V.V.; Nething, U.; Richter, A.; Sellschop, J.P.F.; Шульга, Н.Ф.

doi:10.1103/physrevlett.74.2487

Cited by 48 publications

(30 citation statements)

References 14 publications

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“…This assumption is correct if the formation length of CPR is shorter than the length of multiple scattering. A very good agreement of such simulations and experimental results have been reported from $MeV (Freudenberger et al, 1995) to t10 3 MeV energies (Brenzinger et al, 1997) in the Laue case.…”

Section: Multiple Scatteringsupporting

confidence: 73%

Coherent polarization radiation from crystals irradiated with relativistic charged particles

Nitta

2006

Radiation Physics and Chemistry

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Section: Multiple Scatteringsupporting

confidence: 73%

Coherent polarization radiation from crystals irradiated with relativistic charged particles

Nitta

2006

Radiation Physics and Chemistry

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“…The theoretical description of the intensity distribution of PXR [51,52,45,53,54], suitably modified for self-absorption and multiple-scattering effects, has been tested for a broad range of electron energies extending from 3.5 MeV [55,56] to about 1 GeV [46]. It was found to be accurate within 12%.…”

Section: Parametric X-radiationmentioning

confidence: 99%

Coherent X-rays at MAMI

et al. 2006

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Abstract. Coherent radiation in the range from soft X-rays up to hard X-rays, produced by the lowemittance electron beam of MAMI, can be used for various applications. Novel types of interferometers have been developed for the measurement of the complex index of refraction of thin self-supporting foils. For the vacuum ultraviolet and soft X-ray region the interferometer consists of two collinear undulators, and a grating spectrometer. A foil placed between the undulators causes a phase shift and an attenuation of the oscillation amplitude. The complex index of refraction has been measured at the L 2,3-absorption edges of nickel. A novel method is described for the measurement of the X-ray magnetic circular birefringence. For the hard X-ray region the interferometer consists of two foils at which the 855 MeV electron beam produces transition radiation. Distinct interference oscillations have been observed as a function of both, the photon emission angle and the distance between the foils. The refractive index decrement δ(ω) of a 2 µm thick nickel sample foil has been measured at X-ray energies around the K absorption edge at 8333 eV and at 9930 eV with an accuracy of better than 1.5 %. The line width of parametric X radiation (PXR) was measured in backward geometry with a Si single-crystal monochromator. Upper limits of the line width of 42 meV, 50 meV, and 44 meV, have been determined for the (333), (444) and (555) reflections at photon energies of 5932 eV, 7909 eV, and 9887 eV, respectively. Small angle scattering of the electrons in the crystal leads to a stochastic frequency modulation of the exponentially damped wave train which results in the line broadening. To elucidate the quest if the production of PXR is a kinematical or a dynamical process the radiation from silicon single-crystal targets, emitted close to the electron direction, has been studied. The observed interference structures and the narrow-band radiation in forward direction shows that PXR is produced in a dynamical process. .Ci Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity) -41.60.-m Radiation by moving charges -41.50.+h X-ray beams and X-ray optics PACS.

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“…At the present time the properties of CXR, generated by electrons with energy of several tens of MeV, have been throughout investigated for silicon and germanium [4]- [6], and diamond crystals [7]. At these electron energies features of the incoherent radiation component were studied also in [9] and [10].…”

Section: Introductionmentioning

confidence: 99%

The potentialities of coherent X-radiation for self-assembled systems and liquid crystal research

Gavrikov¹,

Likhachev²,

Neto³

et al. 2004

Braz. J. Phys.

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The potentialities of coherent X-radiation for investigation of structural features of self-assembled systems and liquid crystals was studied using Monte Carlo techniques. The radiation spectra were simulated for the case of interaction of 20 MeV electrons with a liquid crystal, and the influence of the various crystal parameters was studied. The simulations show that coherent X-radiation spectra are almost free of background, and that such measurements could be considered as an alternative to those where Synchrotron sources are used.

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Parametric X-Ray Radiation Observed in Diamond at Low Electron Energies

Cited by 48 publications

References 14 publications

Coherent polarization radiation from crystals irradiated with relativistic charged particles

Coherent polarization radiation from crystals irradiated with relativistic charged particles

Coherent X-rays at MAMI

The potentialities of coherent X-radiation for self-assembled systems and liquid crystal research

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