2020
DOI: 10.36227/techrxiv.13338053
|View full text |Cite
Preprint
|
Sign up to set email alerts
|

Parasitic Capacitance in Copper-Foiled Medium-Voltage Filter Inductors

Abstract: This paper characterizes three parasitic capacitances in copper-foiled medium-voltage inductors. It is found that the conventional modeling method overlooks the effect of the fringe field, which leads to inaccurate modeling of parasitic capacitances in copper-foiled inductors. To address this problem, the parasitic capacitances contributed by the fringe field is identified first, and a physics-based analytical modeling method for the parasitic capacitances contributed by the fringe field is proposed, which avo… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2023
2023
2023
2023

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(2 citation statements)
references
References 26 publications
0
2
0
Order By: Relevance
“…Stored energy ratio of parasitics as a function of Spara for a LV Si IGBT power module [58] and a MV SiC MOSFET power module [21]. [76]. indicates the two voltage class transistor types comparable in power rating; the MV SiC MOSFET power module [21] and the LV IGBT power module [58] respectively.…”
Section: B Additional Semiconductor Lossesmentioning
confidence: 99%
See 1 more Smart Citation
“…Stored energy ratio of parasitics as a function of Spara for a LV Si IGBT power module [58] and a MV SiC MOSFET power module [21]. [76]. indicates the two voltage class transistor types comparable in power rating; the MV SiC MOSFET power module [21] and the LV IGBT power module [58] respectively.…”
Section: B Additional Semiconductor Lossesmentioning
confidence: 99%
“…In [76] the increase in switching energy dissipation is quantified by evaluating the impact of intra-component capacitive couplings between power module B, from [52] populated with 10 kV 3 rd generation Cree dies, and the load inductor, using different grounding configurations of inductor core and frame with different equivalent capacitive coupling magnitudes, and testing at different voltage levels. The results are summarized in Table I where it is shown how an increase in parasitic capacitance has a direct impact on the semiconductor switching energy dissipation.…”
Section: Table I Quantification Of Capacitive Couplings Impact On Sem...mentioning
confidence: 99%