Particle-induced bit errors in high performance fiber optic data links for satellite data management

Abstract

Experimental test methods and analysis tools are demonstrated to assess particle-induced bit errors on fiber optic link receivers for satellites. Susceptibility to direct ionization from low LET particles is quantified by analyzing proton and helium ion data as a function of particle LET. Existing single event analysis approaches are shown to apply, with appropriate modifications, to the regime of temporally (rather than spatially) distributed bits, even though the sensitivity to single events exceeds conventional memory technologies by orders of magnitude. The cross-section LET dependence follows a Weibull distribution at data rates from 200 to 1000 Mbps and at various incident optical power levels. The LET threshold for errors is shown, through both experiment and modeling, to be 0 in all cases! The error cross-section exhibits a strong inverse dependence on received optical power in the LET range where most orbital single events would occur, thus indicating that errors can be minimized by operating links with higher incident optical power. Also, an analytic model is described which incorporates the appropriate physical characteristics of the link as well as the optical and receiver electrical characteristics. Results indicate appropriate steps to assure suitable link performance even in severe particle orbits.

The effects of radiation on 1/f noise in complementary (npn+pnp) SiGe HBTs

“…Experiments with proton fluxes from to can be achieved in the beam current range from about 5 pA to 50 nA. The details of the dosimetry system, which is accurate to about 10%, are described in [5] and [6]. At proton fluence of and , the measured equivalent gamma dose was approximately 135 and 6,759 krad(Si), respectively.…”

“…Radiation experiments have proven to be very useful in probing the physical noise sources in SiGe HBTs [3], [4]. Besides that, proton radiation experiments are also proven to be a useful method to test the reliability of electron devices worked in the out-space [5].…”

Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future

“…High-speed data links, including Optocouplers, can be sensitive to proton induced SEEs [66]- [69]. In [66], the authors report that the proton-induced SET cross section for a optical data links depends on angle of incidence of the proton beam, a result that differs from the classical view of proton testing.…”

“…In [66], the authors report that the proton-induced SET cross section for a optical data links depends on angle of incidence of the proton beam, a result that differs from the classical view of proton testing. In that paper, the angle dependence was determined to be due to direct ionization effects due to protons.…”

Emerging optocoupler issues with energetic particle-induced transients and permanent radiation degradation

“…Outside of the SAA, the recorded SETs are due to high energy cosmic rays or solar event particles that penetrate down to the HST circular 600 km, 29" inclination orbit. In 280 days, 14 SETs have occurred on 2 devices outside of the SAA giving an actual SET rate of 2 . 5 0~1 0 -~ per device-day.…”