“…For example, it allows to study internal MHD-oscillations of plasma and to determine location of the surfaces with a rational value of the stability margin [1,2], to evaluate losses of electrons by using the electron-cyclotron emission ECE [3] and escaping electrons [4], ELM-events [5,6], to monitor L−H-transitions [7] and many more [8][9][10][11][12][13][14][15][16]. Such devices are widely used in the tokamaks JET [17], MAST [8], DIII-D [18], Asdex-Upgrade [19], PDX [20], NSTX [21][22][23], EAST [5], MST [24], TCV [25,26], COMPASS [27,28]. The measurement in X-ray devices is performed without interference into the process under study.…”