PCM-based Matching Networks with Memory for the Mitigation of Transistor Manufacturing Variations

Nunes-Maia, Kariny; Martin, Audrey; Medrel, Pierre; Blondy, Pierre

doi:10.23919/eumc61614.2024.10732392

2024 54th European Microwave Conference (EuMC) 2024

DOI: 10.23919/eumc61614.2024.10732392

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PCM-based Matching Networks with Memory for the Mitigation of Transistor Manufacturing Variations

Kariny Nunes-Maia,

Audrey Martin,

Pierre Medrel

et al.

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PCM-based Matching Networks with Memory for the Mitigation of Transistor Manufacturing Variations

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References 9 publications

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