Penetration depth measurements on type II superconducting films

Henkels, W.H.; Kircher, C. J.

doi:10.1109/tmag.1977.1059426

Cited by 121 publications

(24 citation statements)

References 14 publications

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“…The first idea that comes to mind is that it is caused by a resonance due to a standing wave in the anodized bar. From the normalized Swihart velocities 3/c = (t/e rd) 1/2 = 0.12 in the anodized regions (er, Nb2O s = 29.4 [13]), we find that the lowest resonance voltage for a resonance in the bar is 0.96 mV, largely exceeding 0.36 mV, and we conclude that the bar is not likely to support its own resonant modes, but merely distorts the modes.…”

Section: Quartic With Barmentioning

confidence: 78%

“…The detected voltage signal -AV(x 0, Y0) is proportional to the beam-induced change of the surface losses A Ps. According to basic microwave theory we can write AP s = ~A1 Re{Z~}fs[Htan(X, y)[2 dxdy (13) per electrode, where A Re{Z s} denotes the beaminduced change of the real part of the surface impedance Z~ and Hta n is the tangential component (amplitude) of the RF part of the magnetic field. For an (n, m) Fiske mode in a rectangular junction with length L this reduces to [6] A Ps at k~ sin 2 ( k, x o) COS 2 ( k,.…”

Section: Imaging Of Fiske Resonances By Ltsemmentioning

confidence: 99%

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Field dependence on the Josephson current and Fiske resonances in specially shaped Josephson junctions

Gijsbertsen

Houwman

Klopman

et al. 1995

Physica C: Superconductivity

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We investigated the magnetic-field dependence of the Josephson current and Fiske resonances in specially shaped Josephson junctions. In order to be able to use junctions for high-resolution X-ray spectroscopy, a very good suppression of the sidelobes of both the Josephson current and the Fiske resonances must be achieved.In a theoretical argument we show that a properly chosen junction shape leads to the sidelobe suppression of both the critical current and Fiske resonance amplitudes.The Josephson current and Fiske resonance amplitudes were measured as a function of the magnetic field, for junctions fabricated in Nb/AI technology. As expected, a very good sidelobe suppression was obtained for quartic-shaped junctions. For junctions with anodized structures within the tunneling area, the shape of the internal structures is reflected in the field dependence of both the Josephson current and the Fiske resonances. Finally, Fiske modes in these junctions have been imaged with low-temperature scanning electron microscopy, and we conclude that a quartic junction can be approximated by a rectangle, to describe the lower-order Fiske modes, whereas the high-order modes are specific to the exact shape of the junction.

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Section: Quartic With Barmentioning

confidence: 78%

Section: Imaging Of Fiske Resonances By Ltsemmentioning

confidence: 99%

Field dependence on the Josephson current and Fiske resonances in specially shaped Josephson junctions

Gijsbertsen

Houwman

Klopman

et al. 1995

Physica C: Superconductivity

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show abstract

“…The resonance frequency is given by: , with and the geometric inductance and capacitance per unit length and the resonator length. The kinetic inductance arises from the complex conductivity of the superconducting film, for films with arbitrary thickness [13], [14], with in the dirty limit [15]. The imaginary part arises from the accelerative response of the superconducting condensate, while the real part reflects conduction by the quasiparticles [16].…”

Section: Methodsmentioning

confidence: 99%

Noise in NbTiN, Al, and Ta Superconducting Resonators on Silicon and Sapphire Substrates

Barends

Hortensius

Zijlstra

et al. 2009

IEEE Trans. Appl. Supercond.

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Abstract-We present measurements of the frequency noise and resonance frequency temperature dependence in planar superconducting resonators on both silicon and sapphire substrates. We show, by covering the resonators with sputtered SiO layers of different thicknesses, that the temperature dependence of the resonance frequency scales linearly with thickness, whereas the observed increase in noise is independent of thickness. The frequency noise decreases when increasing the width of the coplanar waveguide in NbTiN on hydrogen passivated silicon devices, most effectively by widening the gap. We find up to an order of magnitude more noise when using sapphire instead of silicon as substrate. The complete set of data points towards the noise being strongly affected by superconductor-dielectric interfaces.

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“…One of the key features is the design of the probe utilized to measure the electromagnetic response from the sample. Motivated by the patterned microstrip configurations employed in some FMR measurements, [9][10][11][12][13][14][15] we utilize a meanderline. Figure 1 illustrates schematically an outline of the device, which generates rf magnetic fields that are both in plane and out of plane with respect to the sample.…”

Section: Apparatusmentioning

confidence: 99%

Microwave absorption measurements using a broad-band meanderline approach

Tsai

Choi

Cho

et al. 2009

Review of Scientific Instruments

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We describe a technique that permits broad-band, field-dependent ferromagnetic and electron paramagnetic resonance absorption measurements that is applicable to thin films and patterned micro-/nanostructured arrays and is based on a wire-wound meanderline approach. Techniques to prepare meanderlines and perform microwave measurements are described along with some demonstrations involving an electron paramagnetic resonance calibration/test material, 2,2-diphenyl-1-picryl-hydrazyl, and a ferromagnetic cobalt thin film. KeywordsMicrowave, absorption, measurements, using, broad, band, meanderline, approach Microwave absorption measurements using a broad-band meanderline approach We describe a technique that permits broad-band, field-dependent ferromagnetic and electron paramagnetic resonance absorption measurements that is applicable to thin films and patterned micro-/nanostructured arrays and is based on a wire-wound meanderline approach. Techniques to prepare meanderlines and perform microwave measurements are described along with some demonstrations involving an electron paramagnetic resonance calibration/test material, 2,2-diphenyl-1-picryl-hydrazyl, and a ferromagnetic cobalt thin film.

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Penetration depth measurements on type II superconducting films

Cited by 121 publications

References 14 publications

Field dependence on the Josephson current and Fiske resonances in specially shaped Josephson junctions

Field dependence on the Josephson current and Fiske resonances in specially shaped Josephson junctions

Noise in NbTiN, Al, and Ta Superconducting Resonators on Silicon and Sapphire Substrates

Microwave absorption measurements using a broad-band meanderline approach

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