Performance Analysis of MixMatch-Based Semi-Supervised Learning for Defect Detection in Manufacturing Processes

,; Kim, Ye-Jun; Jeong, Ye-Eun; Kim, Yong Soo

doi:10.11627/jksie.2023.46.4.312

J. Soc. Korea Ind. Syst. Eng.

2023

DOI: 10.11627/jksie.2023.46.4.312

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Performance Analysis of MixMatch-Based Semi-Supervised Learning for Defect Detection in Manufacturing Processes

Ye-Jun Kim,

Ye-Eun Jeong,

Yong Soo Kim

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Performance Analysis of MixMatch-Based Semi-Supervised Learning for Defect Detection in Manufacturing Processes

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