2017 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe) 2017
DOI: 10.23919/epe17ecceeurope.2017.8098933
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Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system

Roland Sleik
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Michael Glavanovics
2
,
Yevhen Nikitin
3
et al.
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Cited by 3 publications
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Modular dynamic pulse stress test system for discrete high power semiconductors

Patmanidis
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Microelectronics Reliability
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Modular dynamic pulse stress test system for discrete high power semiconductors

Patmanidis
1
,
Glavanovics
2
,
Georgakas
3
et al. 2020
Microelectronics Reliability
1
0
0
0
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Tan
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A Decision Tree-Based Screening Method for Improving Test Quality of Memory Chips

Cheng
1
,
Tan
2
,
Wu
3
et al. 2022
2022 IEEE International Test Conference in Asia (ITC-Asia)
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