Phase Measurement of Optical Fiber via Weak-Value Amplification

Luo, Zhengchun; Wu, Hao; Xu, Li-Ping; Chang, Tianying; Wu, Peng; Du, Chunlei; Cui, Hong‐Liang

doi:10.1109/jsen.2019.2911321

Cited by 9 publications

(1 citation statement)

References 32 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Note that the free-space mounted linear polarizer in CWVA is replaced by the "fiber splicing" technique. This technique has been widely used in other optic-fiber-based systems [29,31,42]. In addition, the upper light path with the Sagnac loop can demonstrate the standard SWVA measurement in the time domain.…”

Section: Cwva For Angular Velocity Measurement In Optic-fiber-based I...mentioning

confidence: 99%

Cascaded weak-value amplification for optic-fiber-based Sagnac interferometers

Jing-Hui

Xue-Ying

et al. 2023

J. Opt. Soc. Am. B

View full text Add to dashboard Cite

In this paper, we propose a scheme for angular rotation Ω measurement in an optic-fiber-based Sagnac interferometer based on cascaded weak-value amplification (CWVA). CWVA is a modified standard weak-value amplification (SWVA) technique for further enhancing temporal shifts based on the principle of the Vernier effect. By choosing the appropriate CWVA parameters and the repetition time intervals of the Vernier scale, the temporal shifts in SWVA can be further amplified by measuring the envelope shifts in CWVA. Our comprehensive simulations demonstrate that CWVA enables the detection of minuscule rotations in the range of 1.0×10−9rad/s≤Ω≤10×10−9rad/s, with significantly improved sensitivity and superior signal-to-noise ratios compared to SWVA. The enhancement with a larger detection band may have great influence on physics and related sciences, such as rotational seismology and gravitational sensing.

show abstract

Section: Cwva For Angular Velocity Measurement In Optic-fiber-based I...mentioning

confidence: 99%

Cascaded weak-value amplification for optic-fiber-based Sagnac interferometers

Jing-Hui

Xue-Ying

et al. 2023

J. Opt. Soc. Am. B

View full text Add to dashboard Cite

show abstract

Nanoscale film thickness measurement based on weak measurement

Qin

Liu

Yue

et al. 2020

Review of Scientific Instruments

View full text Add to dashboard Cite

In this paper, a novel method of film thickness measurement based on weak measurements is proposed by analyzing the quantitative relationship between film thickness and the weak measurement amplified shift of the photonic spin Hall effect, and the corresponding measurement system is established to verify it through experiments. This method can measure the thickness of an arbitrary dielectric film with nanometer resolution. The theoretical analysis and experimental results show that the method is reasonable, feasible, and reliable, and the structure of the measurement system is simple, easy to operate, and easy to assemble into a prototype instrument. The measurement model and method provide not only a new way for the measurement of thin film thickness but also an important reference for the precise measurement of other optical interface parameters.

show abstract