Proceedings of the 49th Annual Design Automation Conference 2012
DOI: 10.1145/2228360.2228407
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Abstract: Technology scaling of SRAM and embedded DRAM is increasingly constrained by limitations such as leakage power and silicon area. Emerging non-volatile memory technologies are considered as the potential SRAM/eDRAM alternatives for last-level caches in terms of energy and area savings. Unfortunately, these non-volatile memory technologies usually have limited write endurance. Even worse, process variation causes some cells to wear out much earlier than others. While state-of-the-art error-tolerant techniques suc… Show more

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Cited by 13 publications
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