“…X-rays can pass through the gas phase, and thus in situ PTRF-XAFS measurements can be performed in the presence of a gas phase (Tanizawa et al, 2003;Chun et al, 1997;Asakura et al, 1997). In addition, the PTRF-XAFS method can be applied to surface analysis in the liquid phase (Masuda et al, 2012;Yuan et al, 2018Yuan et al, , 2017Gullikson, 2001;Henke et al, 1993;Nelson et al, 1994). However, the elastic X-ray scattering of the liquid overlayer becomes large and causes a serious increase of background X-rays; hence the liquid overlayer should be made as thin as possible.…”