1974
DOI: 10.1109/tns.1974.4327478
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Polarization Phenomena in CdTe Nuclear Radiation Detectors

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Cited by 117 publications
(39 citation statements)
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“…Degradations occur more rapidly at high temperatures, at low bias voltages and for thick detectors, as widely shown in several works [10,[12][13][14][15][16][17]. Several solutions have been proposed to suppress polarization: high bias voltage operation, low temperature, low detector thickness, and switching off the bias voltage at regular time intervals.…”
Section: Introductionmentioning
confidence: 90%
See 1 more Smart Citation
“…Degradations occur more rapidly at high temperatures, at low bias voltages and for thick detectors, as widely shown in several works [10,[12][13][14][15][16][17]. Several solutions have been proposed to suppress polarization: high bias voltage operation, low temperature, low detector thickness, and switching off the bias voltage at regular time intervals.…”
Section: Introductionmentioning
confidence: 90%
“…Therefore, the high bias voltage operation and the fine segmentation of the electrodes of Al/CdTe pixel detectors make them very attractive for high-resolution spectroscopic imaging, recently proposed in astrophysics, diagnostic medicine, industrial imaging, and security screening. Time instability under bias voltage (generally termed as polarization) is the major drawback of CdTe diode detectors, as well documented in the literature [12][13][14].…”
Section: Introductionmentioning
confidence: 93%
“…This phenomenon has been widely studied for Si, Ge, and CdTe detectors 22,23 but up to now no quantitative analysis has been reported in literature on diamond based detectors. This phenomenon arises from changes with time in the electrical field in the active diamond intrinsic layer due to accumulation of space charge in deep trap levels during the application of the bias voltage.…”
Section: B Alpha Particles Spectramentioning
confidence: 99%
“…Early CdTe detectors suffered from polarisation; the progressive loss of sensitivity due to a time-dependent reduction in charge collection or depletion thickness (Bell et al 1974;Malm and Martini 1974;Siffert et al 1976), although more recent detectors have largely overcome this (Bojsen 1984;Frederick et al 1987). To identify any polarisation with the CdTe probe, counts were recorded using a SVCo source in a fixed geometry with a multi-channel analyser set to multiscaler mode.…”
Section: Materials and M E T H O D Smentioning
confidence: 99%