Spontaneous or stress-induced polarization, signifying pyroelectricity and piezoelectricity, respectively, can appear in ionic solids solely due to a non-centrosymmetrical spatial distribution of ions in a polar crystalline structure. Although theory does not impose strict limitations on the size of a polar crystallite, [1,2] the magnitude of pyroelectric and piezoelectric effects of some ceramics, particularly BaTiO 3 , rapidly decrease as grain size diminishes to a few nanometers. [1,3,4] Determination of the minimal number of periodically arranged unit cells for which a crystal retains pyroelectric and piezoelectric properties has become increasingly important due to the rapid incorporation of these materials into nanometer-scale devices. An intriguing complication to this quest arises from the fact that pyro-and piezoelectric effects may exist in structures that lack the spatial periodicity inherent for ionic crystals, but are composed of polar molecules with directional ordering. An example of such a material is a nematic liquid crystal. Spontaneous or stress-induced dipole ordering without fine-tuned positional order is theoretically possible in ionic solids [5] as well; however, only indirect experimental evidence supporting this theory has been presented so far.[6±9] The present work reports on the preparation and pyroelectric properties of quasiamorphous BaTiO 3 thin films that represent a polar ionic solid without spatial periodicity. Pyroelectric amorphous BaTiO 3 films were obtained by passing sputtered amorphous BaTiO 3 films through a steep temperature gradient. As-deposited BaTiO 3 films were stressfree (< ± 30 MPa) with refractive indices in the range of n^= 1.97±2.02, and a very small in-plane±out-of-plane birefringence of n i ± n^= ± (0.002±0.008), confirming film isotropy. A compressive stress of r e = 2.0±2.2 GPa developed in the films passed through the temperature gradient. The refractive index of these films decreased to n^= 1.89/1.94 but the birefringence grew to n i ± n^= 0.03±0.07, corroborating the existence of high in-plane compressive stress.X-ray diffraction (XRD) spectra of the films passed through the temperature gradient were indistinguishable from those of as-deposited films (Fig. 1a). No XRD peaks apart from those of the Si substrate were observed, indicating the absence of a crystalline phase. The volume detection limit of a crystalline phase by XRD calculated from the signal to noise ratio [10] was < 0.3 %. Furthermore, thorough transmission electron microscopy (TEM) investigation only rarely detected the presence of crystalline grains (Fig. 1b) [11] and the concentration of the crystallites estimated from TEM images was far below 0.3 %. In contrast to the similarity with respect to electron and X-ray diffraction analysis, as-deposited films and the films passed through the temperature gradient have distinctly different electrical properties. The films passed through the temperature gradient show a large pyroelectric effect p measured = (1±3) 10 ±9 C cm ±2 K ±1 (5±15 % that of...