Stereology and Quantitative Metallography 1972
DOI: 10.1520/stp36848s
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Practical Applications of Quantitative Metallography

Abstract: An improved procedure based on the intercept method of measuring the grain size of single-phase microstructures has been developed that provides a quantitative description of the grain size yet is fast. The procedure combines the statistical advantage of using large numbers with the advantage of interpreting the data as a normal distribution, as verified by the chi square test. Application of the procedure to ferritic microstructures representative of best and worst case conditions indicates that accuracies on… Show more

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Cited by 18 publications
(2 citation statements)
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“…Numerous methods currently under development are based on numerical calculations [13,14,15] or deep learning methods [16,17,18]. Finally, several methods can be used to measure the grain size [19], including the intercept method [20,21] and standardised methods, such as planimetric grain size measurement [22]. A set of several hundreds of grains (typically 500-1000) is generally considered to statistically account for the grain size distribution in the material.…”
Section: Introductionmentioning
confidence: 99%
“…Numerous methods currently under development are based on numerical calculations [13,14,15] or deep learning methods [16,17,18]. Finally, several methods can be used to measure the grain size [19], including the intercept method [20,21] and standardised methods, such as planimetric grain size measurement [22]. A set of several hundreds of grains (typically 500-1000) is generally considered to statistically account for the grain size distribution in the material.…”
Section: Introductionmentioning
confidence: 99%
“…Não existem muitos estudos sobre o uso do coeficiente de variação em aplicações de engenharia dos materiais. Alguns trabalhos propõe o uso de coeficiente de variação aplicado a medições de partículas (NATIONAL PHYSICAL LABORATORY, 2009) e de tamanho de grão por microscopia ótica (ABRAMS, 1972).…”
Section: 𝐶𝑉 = 𝜎 𝑥̄unclassified