Prediction of Functional Electronic Block Performance Through Localization of Malfunctions

Lytle, W. J.; Merck, John W.; Dzimianski, J. W.; Skinner, S. M.

doi:10.1109/irps.1963.362248

Second Annual Symposium on the Physics of Failure in Electronics

1963

DOI: 10.1109/irps.1963.362248

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Prediction of Functional Electronic Block Performance Through Localization of Malfunctions

W. J. Lytle

John W. Merck

J. W. Dzimianski

et al.

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Prediction of Functional Electronic Block Performance Through Localization of Malfunctions

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