2022
DOI: 10.1063/5.0114511
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Preface for the special topic on “ion source diagnostics”

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Cited by 3 publications
(2 citation statements)
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“…Among other techniques, X-ray plasma diagnostics were developed over the years, allowing for the volumetric characterization of ECR plasmas. The volume-integrated X-ray diagnostics in the soft-X domain (from 1 keV to 30 keV) were adopted to estimate the spectral temperatures in different plasma conditions and various ECR setups vs RF power, gas pressure, and the magnetic field profile [16,[31][32][33][34][35][36][37][38][39].…”
Section: X-ray Pin-hole Cameramentioning
confidence: 99%
“…Among other techniques, X-ray plasma diagnostics were developed over the years, allowing for the volumetric characterization of ECR plasmas. The volume-integrated X-ray diagnostics in the soft-X domain (from 1 keV to 30 keV) were adopted to estimate the spectral temperatures in different plasma conditions and various ECR setups vs RF power, gas pressure, and the magnetic field profile [16,[31][32][33][34][35][36][37][38][39].…”
Section: X-ray Pin-hole Cameramentioning
confidence: 99%
“…Therefore, to acquire a deeper understanding of the plasma properties, non-invasive diagnostic methods are needed for reliable analysis of the plasma. There are multiple different ways of studying plasma without influencing it [1,2], for example using the escaping ion and electron populations or through the different types of radiation emissions, such as bremsstrahlung and microwaves [3]. Plasma also emits radiation in the visible part of the light spectrum, which enables the use of optical emission spectroscopy (OES) as a non-invasive diagnostic method.…”
Section: Introductionmentioning
confidence: 99%