2005
DOI: 10.5012/bkcs.2005.26.9.1453
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Preparation of In2S3Thin Films by MOCVD Using Single Source Precursors: Tris(N,N-ethylbutyldithiocarbamato)indium(III) and Tris(2-ethylpiperidinedithiocarbamato)indium(III)

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Cited by 6 publications
(4 citation statements)
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“…The growth rate of the In 2 S 3 films was 2.8 nm/min on average at the temperature region near 370 °C. However, the rate notably increased to 43.3 nm/min at the higher temperature region of 490 °C 2 XRD pattern of the In 2 S 3 thin films deposited at different temperatures on glass.…”
Section: Resultsmentioning
confidence: 97%
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“…The growth rate of the In 2 S 3 films was 2.8 nm/min on average at the temperature region near 370 °C. However, the rate notably increased to 43.3 nm/min at the higher temperature region of 490 °C 2 XRD pattern of the In 2 S 3 thin films deposited at different temperatures on glass.…”
Section: Resultsmentioning
confidence: 97%
“…The In(ebdtc) 3 precursor was also quite stable in ambient conditions and had a relatively lower melting point with a short decomposition temperature range in comparison to the known similar precursors, suggesting that it can be used in the MOCVD process under relatively milder conditions …”
Section: Resultsmentioning
confidence: 99%
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