1996
DOI: 10.1017/s0424820100164891
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Procedures for x-ray microanalysis of layered structures: accuracy and limits

Abstract: The procedures presently available for X-ray microanalysis (XRMA) of layered structures derive more or less directly from the semi-empirical ϕ(ρz) models proposed in the 80's. In the last years, the spreading of advanced computer programs such as Strata made more people aware than these methods were effective, and could be used in many cases as a complement or a substitute to near-surface analysis methods. New approaches for ϕ(ρz) reconstruction, based on the angular and energetic distributions of the electron… Show more

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Cited by 4 publications
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“…After calibration with standards, i.e. material of known composition, the calibrated intensities are transformed to partial mass coverage with the help of a special thin-film algorithm assuming a laterally homogeneous film containing the elements Zn, P, S, O and Ca on a substrate consisting of 100Cr6 steel (Pouchou and Pichoir, 1991; Pouchou and Thiot, 2021). To prepare EPMA measurements, the rolling elements had to be cleaned from grease with alternating baths of ethanol and acetone.…”
Section: Methodsmentioning
confidence: 99%
“…After calibration with standards, i.e. material of known composition, the calibrated intensities are transformed to partial mass coverage with the help of a special thin-film algorithm assuming a laterally homogeneous film containing the elements Zn, P, S, O and Ca on a substrate consisting of 100Cr6 steel (Pouchou and Pichoir, 1991; Pouchou and Thiot, 2021). To prepare EPMA measurements, the rolling elements had to be cleaned from grease with alternating baths of ethanol and acetone.…”
Section: Methodsmentioning
confidence: 99%
“…The phase compositions of were studied with an INCA X-Max EDS analyser (Oxford Instruments, UK) using mineral standards manufactured by SPI Supplies Inc. (West Chester, PA, USA). INCA Energy uses the XPP matrix correction scheme developed by Pouchou and Pichoir (1992) and supplied by Oxford Instruments. Selected freeze lining samples were examined with X-ray diffractometry (XRD; Bruker AXS D8 Focus, USA) to identify their crystalline phase assemblies.…”
Section: Methodsmentioning
confidence: 99%