Properties of planar structures based on Policluster films of diamond and AlN

Carbon nanowalls in field emission cathodes

“…On the Raman spectra of the Si/СNW/NiO * /СNW structure, the band intensity at Dn = 2285 cm -1 increased almost 4-fold. The wide band at Dn = 2262-2286 cm -1 (broadening of the Dn 1/2 = 120-160 cm -1 band) was manifested in the Raman spectra of СNW after annealing at temperatures above 870 K [7]. A similar band was also observed on the Raman spectra of polycluster diamond films produced by the microwave discharge method [3].…”

“…Autocathodes are used in the development of X-ray tubes, microwave devices, electron guns for exciting lasers, cathodoluminescent lighting devices, flat displays and other devices [1][2][3][4][5]. The most promising for the creation of autocathodes with a low electron emission barrier are the so-called carbon nanowalls (CNW) -layers of a plate-like carbon material with a predominant orientation of the plates perpendicular to the substrate [1][2][3].The layers of carbon materials formed by plasma methods, including CNW, are as a rule multiphase layers [6][7][8]. The structure and concentration of crystalline and X-ray amorphous phases depend on the conditions for carbon materials formation and affect their emission properties.…”

“…The layers of carbon materials formed by plasma methods, including CNW, are as a rule multiphase layers [6][7][8]. The structure and concentration of crystalline and X-ray amorphous phases depend on the conditions for carbon materials formation and affect their emission properties.…”

Dielectric Losses in Nanosized Ferroelectric and Diamond-Like Films on SHF

“…Diamond and diamond-like films received from carbon plasma have unique properties [9][10][11][12]. The main physical properties of such diamond-like films are lack of the hysteresis phenomena of properties at abnormally high heat conductivity that is perspective for their use in high power SHF devices of gigahertz frequency range.…”

AlN Nanostructured Piezoelectric Films obtained by Reactive RF Magnetron Sputtering.

“…01 1 2)); б) 90 мм (1 -поликор; 2 -Al 2 O 3 (01 1 2)). Зависимость параметров решетки от: а) толщины пленок AlN, выращенных при 370 (1) и 670 К (2) на подложках: 1 -поликор; 2 -Al 2 O 3 (011 2) (3 -теоретические величины); б) положения анализируемого участка пленки относительно мишени. Расстояние от мишени до подложки 50 (1-3) и 90 мм (1', 2', 4') (материал подложек: 1, 1' -плавленый кварц; 2, 2' -поликор; 3 -Al 2 O 3 (01 1 2); 4' -Al 2 O 3 (0001)), 5 -теоретическая величина.…”