“…Importantly, this overlap constraint is powerful enough to estimate not only the object but also the illumination function (probe) even in non-ideal experimental conditions, e.g. partial coherence, broad bandpass illumination or a thick object (Maiden & Rodenburg, 2009;Thibault et al, 2009;Thibault & Menzel, 2013;Claus et al, 2013;Edo et al, 2013;Suzuki et al, 2014;Batey et al, 2014;Clark et al, 2014;Enders et al, 2014). Hence, ptychography is also an ideal tool for analysing X-ray wavefields (Schropp et al, 2010;Kewish, Guizar-Sicairos et al, 2010;Kewish, Thibault et al, 2010;Hö nig et al, 2011;Vila-Comamala et al, 2011;Wilke et al, 2012;Schropp et al, 2013;Huang et al, 2013).…”