PtyNAMi: Ptychographic Nano-Analytical Microscope at PETRA III: interferometrically tracking positions for 3D x-ray scanning microscopy using a ball-lens retroreflector

Abstract

In recent years, ptychography has revolutionized x-ray microscopy in that it is able to overcome the diffraction limit of x-ray optics, pushing the spatial resolution limit down to a few nanometers. However, due to the weak interaction of x rays with matter, the detection of small features inside a sample requires a high coherent fluence on the sample, a high degree of mechanical stability, and a low background signal from the x-ray microscope. The x-ray scanning microscope PtyNAMi at PETRA III is designed for high-spatial-resolution 3D imaging with high sensitivity. The design concept is presented with a special focus on real-time metrology of the sample position during tomographic scanning microscopy.

Multi-slice ptychography enables high-resolution measurements in extended chemical reactors

“…The polyimide foil with the copper(I) oxide particles on both sides was glued to a thin silicon frame, covering a hole of 10 mm diameter. The plate with the foil on top was clamped into a sample holder, which was placed inside the PtyNAMi setup 46,47 . The X-ray beam coming from the undulator was monochromatized to 9.1 keV using a Si-(111) double-crystal monochromator.…”

“…The experiment was again performed at the hard X-ray nanoprobe station PtyNAMi of beamline P06 at the synchrotron radiation source PETRA III (Hamburg, Germany) 44,45 . The whole chemical reactor with all connections needed to potentially operated it, was placed inside the PtyNAMi setup 46,47 . In this experiment, the chemical reactor was kept at room temperature.…”

Coupled ptychography and tomography algorithm improves reconstruction of experimental data

“…We recorded a ptycho-tomographic data set at the Ptychographic Nano-Analytical Microscope (PtyNAMi) at beamline P06 of the synchrotron-radiation source PETRA III at the Deutsches Elektronen-Synchrotron DESY in Hamburg, Germany [17]. The instrument is built for ptychographic imaging with high spatial resolution [18] and sensitivity [19], as well as with chemical contrast [20].…”

“…The sample was aligned in the x-ray microscope [17] using an optical microscope. The incident 9 keV photon beam was focused to a 70 nm spot using a Fresnel zone plate.…”

Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: signal-to-background optimization for imaging with high sensitivity

“…The basic design was described in Ref. 6 with a focus on the mechanical stability of the instrument. In this article, we briefly review the instrument and focus on the effects of the instrumental scattering background on the image quality.…”