2018
DOI: 10.1103/physrevb.98.165301
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Pulse sequence designed for robust C -phase gates in SiMOS and Si/SiGe double quantum dots

Abstract: We theoretically analyze the errors in one-and two-qubit gates in SiMOS and Si/SiGe spin qubit experiments, and present a pulse sequence which can suppress the errors in exchange coupling due to charge noise using ideal local rotations. In practice, the overall fidelity of the pulse sequence will be limited only by the quality of the single-qubit gates available: the C-phase infidelity comes out to be ≈ 2.5× the infidelity of the single-qubit operations. Based on experimental data, we model the errors and show… Show more

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Cited by 25 publications
(44 citation statements)
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“…We point out that this technique can also be applied to heavy-hole systems, where the control of the hole spin via the tunneling and strong SOC has been demonstrated for silicon-based DQDs [34]. Recent publications presenting theoretical proposals for DQD with strong SOC [19,20] and transverse magnetic field [35] are potentially consistent with our method and can be compared to other protocols based on the approach proposed here. Finally, a similar approach can be used to design the spin and mass transport of cold atoms in optically produced potentials [36].…”
Section: Discussionsupporting
confidence: 59%
“…We point out that this technique can also be applied to heavy-hole systems, where the control of the hole spin via the tunneling and strong SOC has been demonstrated for silicon-based DQDs [34]. Recent publications presenting theoretical proposals for DQD with strong SOC [19,20] and transverse magnetic field [35] are potentially consistent with our method and can be compared to other protocols based on the approach proposed here. Finally, a similar approach can be used to design the spin and mass transport of cold atoms in optically produced potentials [36].…”
Section: Discussionsupporting
confidence: 59%
“…Assuming further a constant distribution of activation energies, P(E, T ) = const and inserting this into Eq. 13 the characteristic 1/f noise with a linear temperature dependence can be reproduced [28],…”
Section: Temperature Dependence Of the Dephasing Timesmentioning
confidence: 95%
“…To improve the fidelity and robustness of these threequbit gates, it may be advantageous to employ dynamically corrected gates [46]. Provided the noise dynamics are slow compared to the gate times, such methods can lead to substantial improvements in the gate fidelities and robustness of the gates to calibration errors [6,47,48].…”
Section: Outlook and Conclusionmentioning
confidence: 99%