Pulsed 70 kV X-ray sensing behavior of Cu2HgI4 thick films

Praveenkumar, P.; Subashini, T.; Rakini, S.; Prakash, T.

doi:10.1016/j.mssp.2018.11.032

Cited by 10 publications

(2 citation statements)

References 28 publications

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“…The diffuse reflectance spectrum (DRS) of nanocrystalline BiPO 4 is shown as figure 3(c) and it reveals the reflectance of the sample is about ~68%. In order to identify the energy bandgap (E g ) value, the obtained reflectance data were applied for Kubelka-Munk (KM) function analysis [9]. The obtained plot is shown as figure 3(d).…”

Section: Spectroscopic Investigationmentioning

confidence: 99%

“…Recently, our research group has explored the possibility of utilizing semiconductors such as Cu 2 HgI 4 [9], CsPbI 3 [10], BiOI [11] and Zn(Cu)O [12] for direct conversion low-dose (mGy) x-ray sensors based on the x-ray-induced photocurrent measurements under biased condition. In general, a semiconductor with high x-ray attenuation is an ideal candidate for such sensor development.…”

Section: Introductionmentioning

confidence: 99%

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Dose-dependent x-ray sensing nature of nanocrystalline bismuth phosphate thick films

Begum

Karthieka

Kumar

et al. 2020

Semicond. Sci. Technol.

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Bismuth and its compounds have been used in various optoelectronic devices because of their unique physical properties and non-toxic nature. In this present study, nanocrystalline bismuth phosphate (BiPO4) was synthesized by solid-state double exchange reaction and then processed at 150 °C for 30 min under nitrogen gas flow. The phase, morphology, purity and band gap of the sample were analyzed respectively using x-ray diffraction, scanning electron microscopy-energy dispersive x-ray, Fourier transform infrared, Raman and diffuse reflectance spectroscopy. The obtained results reveal that the sample exists in hexagonal phase with crystallites in sub-spherical morphology (∼84 nm) and having a direct transition band gap of 4.52 eV. Furthermore, the x-ray attenuating nature of nanocrystalline BiPO4 thick film was examined using an intra-oral diagnostic x-ray machine interfaced with a Suniray-2 radiography image sensor. A theoretical validation of the obtained x-ray attenuating nature was carried out using the NIST-XCOM online resource. Then, x-ray-induced photocurrent was measured for nanocrystalline BiPO4 thick (200 µm) film for four different doses (mGy) exposed under biased condition (2 V). A grain boundary double Schottky potential barrier height (ϕb) model was applied to explain the observed linear dose-dependent x-ray sensing nature.

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Section: Spectroscopic Investigationmentioning

confidence: 99%