Microsc Microanal
 2020
DOI: 10.1017/s1431927620020322
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Pulsed-Laser-Driven TEM for Studying Temporal Aspects of Beam Damage

David J. Flannigan
1
,
Elisah VandenBussche
2

Abstract: This is an Accepted Manuscript for the Microscopy and Microanalysis 2020 Proceedings. This version may be subject to change during the production process.

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