PV cells electrical parameters measurement

Abstract

When measuring optical parameters of a photovoltaic silicon cell, precise results bring good electrical parameters estimation, applying well-known physical-mathematical models. Nevertheless, considerable re-combination phenomena might occur in both surface and intrinsic thin layers within novel materials. Moreover, rear contact surface parameters may influence close-area re-combination phenomena, too. Therefore, the only precise electrical measurement approach is to prove assumed cell electrical parameters. Based on theoretical approach with respect to experiments, this paper analyses problems within measurement procedures and equipment used for electrical parameters acquisition within a photovoltaic silicon cell, as a case study. Statistical appraisal quality is contributed.

Impact of Reducing Statistically Small Population Sampling on Threshold Detection in FBG Optical Sensing

“…The ε instr is a sum of all instrumentation errors and includes fluctuations in the wavelength discretization, quantization, deviations, or offsets due to internal or external environmental changes. Procedures for calculating total instrumentation error are explained in [30] using qualitative parameters of involved devices in the given experimental setup. In this case, the FBG sensing instrumentation error is influenced by wavelength measurements with an accuracy of ±10 pm and power measurements of ±2%, regardless of whether a slow or fast scanning mode was used.…”

Assessment of encapsulation materials for solar cells

“…Insulation properties and dielectric properties are among the important indicators tested at the beginning and also during lifetime of photovoltaic module [2]. Dielectric and electric tests are common to ensure the efficient operation and safety over time [3,4]. The encapsulant as an electric insulator has to withstand electric stress which when steadily increased, finally overcomes electric strength.…”