Qualification-testing and field-reliability results for 980-nm pump lasers

Grasso, G.; Magistrali, F.; Salmini, G.; Oosenbrug, A.; Jakubowicz, A.; Darby, D.; Whitney, Peter

doi:10.1364/ofc.1995.thc2

Cited by 9 publications

(8 citation statements)

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“…The activation energy appeared also in laser diodes and light emitting diodes (LED) having facet coating films and Au-Sn hard solder [31]. These AlGaAs:GaAs lasers were still not reliable enough for optical communication systems and a new failure mode was discovered, the generation of <100> threading dislocations or COMD at the interface between the semiconductor and the dielectric film [36]. The same failure mode in InGaAsP:InP lasers was found to be less prevalent because the InGaAsP:InP material system is more insensitive to crystal defects [37].…”

Section: Semiconductor Laser Degradationmentioning

confidence: 99%

Nitride facet passivation raises reliability, COMD, and enables high-temperature operation of InGaAsP, InGaAs, and InAlGaAs lasers

Silfvenius¹,

Sun²,

Blixt³

et al. 2005

SPIE Proceedings

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The laser diode technology, underpinning applications such as data storage, industrial lasers and optical telecommunications, still suffers from reliability and longevity limitations, especially in high power applications. A main problem for these lasers arises from facet oxidation, leading to increased absorption, power degradation and COMD device failure. Typically, high power devices initially show a low linear degradation and after some 100 hours, the degradation accelerates in a nonlinear fashion, indicating a degradation runaway condition. This article reports performance and reliability improvements that are based on a process which atomically seals surfaces and eliminates oxidation by forming stable nitrides on laser facets. The dangling bond terminating technology suppresses accelerated degradation associated with optical density and heat at laser facets. The dangling bond termination is demonstrated by improved COMD, decreased degradation at CW operation and a constant linear degradation rate at different QW temperature conditions (nonlinear degradation indicates advancement in the oxidation/optical absorption/facet heating/oxidation spiral). The technology is applicable to a range of material systems and has previously been demonstrated on InAlGaAs and InGaAs (increased COMD to >270 and 470mW/µm respectively). The devices with the typically lowest COMD levels (AlInGaAs) show a remarkably low linear degradation rate of <0.5%/kh during at CW life test operation at 90˚C and a power level corresponding to 80W bar power. In addition to long term AlInGaAs laser life test results, this paper presents results on nitride facet passivation applied to 805nm InGaAsP devices, showing improved COMD to 400mW/µm and the initial CW life data confirms the general behavior of the previously life-tested InGaAs and InAlGaAs based devices.

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Section: Semiconductor Laser Degradationmentioning

confidence: 99%

Nitride facet passivation raises reliability, COMD, and enables high-temperature operation of InGaAsP, InGaAs, and InAlGaAs lasers

Silfvenius¹,

Sun²,

Blixt³

et al. 2005

SPIE Proceedings

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“…The package is hermetically sealed using standard seam sealing techniques with a mix of argon/oxygen atmosphere, the oxygen is present to reduce the package induced failures 41,42 . A getter fixed onto the package lid is also sealed into the package at this stage to eliminate hydrocarbons and moisture, as even though the package is sealed hermetically moisture and hydrogen will still enter the package even with a low leak rate.…”

Section: Hermetic Sealingmentioning

confidence: 99%

Use of glass solder in fixing an optical fiber in a laser package

Galeotti¹,

Shaw²,

Musio³

et al. 2002

SPIE Proceedings

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In order to couple the light emitted from a semiconductor laser into the core of an optical fibre, where the core and laser emitting are not matched, it is necessary to use a lens system. This lens system then focuses the divergent light into the fibre core, often this lens is fabricated on the end of the fibre. When the lens is on the end of the fibre, it must be fixed in place in front of the emitting laser using a method that will hold the fibre in position relative to the laser during the lifetime of the laser. This reliability requirement is particularly critical in the case of lasers with a highly elliptical output beams. The tolerances for the displacement of the lensed fibre relative to the laser are extremely tight, a movement of less than 0.5 microns in the vertical direction can cause a drop in coupled power of greater than 10%. In this paper existing techniques of fixing the fibre relative to the laser are outlined and contrasted with an improved method using glass solder. The improved method is described with salient features such as the fixing of the fibre to a rigid support member and the laser welding process used to fix the rigid support member in front of the laser explained in detail. Other aspects of the laser design including thermal dissipation are also discussed in detail. Finite element analysis (FEA) has used extensively to demonstrate the capacity of the design. Device performance and reliability information is also presented demonstrating the capability of this technique in the fixing of an optical fibre relative to a laser device.

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“…48 An international joint work by Pirelli, IBM, and Lasertron had a big impact on those concerned with pump laser reliability at OFC'95. 4 The report of this work included reliability data from accelerated aging tests and the field deployment of EDFAs operating with 576 lasers in an 2.5 Gb/s long-distance fiber link between Salt Lake City and Chicago. Over 4 million device hours of field operation had been accumulated, and the lifetime of lasers was estimated to be more than 2.2 x 10 5 hours during 200 mW operation at 50° C. The calculated failure rates based on the data are shown in Fig.…”

Section: Nm Lasersmentioning

confidence: 99%

“…In 1995, however, the field data for EDFAs pumped with 980 nm strained QW lasers indicated that these lasers have a longer device lifetime, more than 10 5 hours, and lower failure rate less than 1500 FIT over 25 years under practical operating conditions. 4 The 980 nm lasers have thus been recognized as practical optical pumping sources, although their fabrication is still more difficult than that of 1480 nm QW lasers.…”

Section: Introductionmentioning

confidence: 99%

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Reliability of High Power Pump Lasers for Erbium-Doped Fiber Amplifiers

FUKUDA

1996

Selected Topics in Electronics and Systems

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The degradation behavior and the reliability of 980 nm lasers and 1480 nm lasers are reviewed and discussed. In addition, packaging problems for the high power lasers are also discussed from the application viewpoint. For 980 nm lasers the reliability in laser chip is limited mainly by the instability of an interface between the laser material (facet) and the anti-reflecting coating film, and for most 1480 nm lasers the reliability of the laser chip is determined mainly by the instability of a buried heterointerface. These reliability problems have been solved, however, by examining the material properties and improving device fabrication technology. The main packaging problem is a packaginginduced failure (PIF) causing sudden failure in 980 nm lasers sealed in dry N2 or Ar, but packaging problems have also been suppressed or eliminated. The device technology and packaging technology needed to make high power pump laser modules have been established, and erbium-doped fiber amplifiers pumped by these lasers are indispensable components of many optical transmission systems. 55 Current Trends in Optical Amplifiers and Their Applications Downloaded from www.worldscientific.com by UNIVERSITY OF BIRMINGHAM LIBRARY -INFORMATION SERVICES on 03/21/15. For personal use only. Current Trends in Optical Amplifiers and Their Applications Downloaded from www.worldscientific.com by UNIVERSITY OF BIRMINGHAM LIBRARY -INFORMATION SERVICES on 03/21/15. For personal use only.

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Qualification-testing and field-reliability results for 980-nm pump lasers

Cited by 9 publications

References 0 publications

Nitride facet passivation raises reliability, COMD, and enables high-temperature operation of InGaAsP, InGaAs, and InAlGaAs lasers

Nitride facet passivation raises reliability, COMD, and enables high-temperature operation of InGaAsP, InGaAs, and InAlGaAs lasers

Use of glass solder in fixing an optical fiber in a laser package

Reliability of High Power Pump Lasers for Erbium-Doped Fiber Amplifiers

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