Quantitative depth profiling of Al3Hf phase formed by Hf ions implantation into aluminum

Wang, Miao; Tao, Kun; Liu, Xingtao; Li, Bin; Liu, Baixin

doi:10.1016/s0042-207x(02)00537-7

Vacuum

2003

DOI: 10.1016/s0042-207x(02)00537-7

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Quantitative depth profiling of Al3Hf phase formed by Hf ions implantation into aluminum

Miao Wang

Kun Tao

Xingtao Liu

et al.

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Quantitative depth profiling of Al3Hf phase formed by Hf ions implantation into aluminum

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References 11 publications

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