Quantitative texture analysis of small domains with synchrotron radiation X-rays

Abstract

Quantitative analysis of crystallographic preferred orientation (texture) of very small volumes in ®ne-grained polycrystalline materials has been carried out with a monochromatic X-ray microbeam ( 30 mm) at the microfocus beamline of the European Synchrotron Radiation Facility (ESRF). The experimental procedure is described and illustrated with textures of rolled aluminium, aluminium and steel wires, polymer ®bers and natural bone material (apatite).

Hard X-ray studies of stress-induced phase transformations of superelastic NiTi shape memory alloys under uniaxial load

“…Using the software FIT2D [10] the image plate data were corrected for centre and tilt misalignments. Local background subtraction and polarization correction is also applied to the measured intensities [11]. Diffraction intensities were extracted with FIT2D into a multicolumn ASCII spread sheet [12], where each column corresponds to an intensity distribution along the azimuth for a particular 2θ value.…”

Diffraction techniques and vibrational spectroscopy opportunities to characterise bones

“…Recent experimental developments combining a monochromatic X-ray beam (<30μm) with a charge-coupled device camera allow a relatively easy quantification of crystal alignment in bone tissue [44].…”

X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

“…The three dimensional Ið; zÞ data were transformed into Ið ; zÞ dependencies using a simple transformation from Heidelbach et al (1999) linking and angles (cf. Fig.…”

“…The approach opens the possibility to analyse stresses in graded thin films (Bartosik et al, 2013) and correlate them with texture, crystallite size and phase gradients. The characterization of fibre texture is trivial, including also full orientation distribution function calculation, especially in the case of in-plane isotropic thin films with a fibre axis oriented perpendicular to the substrate surface (Heidelbach et al, 1999;Keckes et al, 2012).…”