Radiation evaluation method of commercial off-the-shelf (COTS) electronic printed circuit boards (PCBs)

LaBel, Kenneth A.; Marshall, P.W.; Gruner, T.D.; Reed, Robert A.; Settles, B.; Wilmot, J.; Hanford, Dougherty, L.F., Westinghouse; Russo, Analisa; Foster, M.G.; Yuknis, W.; Darrin, M. Ann Garrison

doi:10.1109/radecs.1999.858637

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)

DOI: 10.1109/radecs.1999.858637

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Radiation evaluation method of commercial off-the-shelf (COTS) electronic printed circuit boards (PCBs)

Kenneth A. LaBel

P.W. Marshall²,

T.D. Gruner³

et al.

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Cited by 7 publications

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Single event upset testing of commercial off-the-shelf electronics for launch vehicle applications

Castillo

Ratkevich

2011

2011 Aerospace Conference

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Radiation evaluation method of commercial off-the-shelf (COTS) electronic printed circuit boards (PCBs)

Cited by 7 publications

References 2 publications

Single event upset testing of commercial off-the-shelf electronics for launch vehicle applications

Single event upset testing of commercial off-the-shelf electronics for launch vehicle applications

A methodology for estimating reliability of SmallSat computers in radiation environments

A Flight Platform Design that Supports Multiple Batches of Components

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