EE.SD
 2018
DOI: 10.36845/2073-8250-2018-248-1-28-34
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Radiation Hardness Estimation and Assurance of Solid -State Microwave Electronics by the Choice of the Criteria Parameters

G. V. Chukov1,
V. V. Elesin2,
G. N. Nazarova3
et al.

Abstract: завиСимоСтЬ радиаЦионной СтойкоСти изделий твердотелЬной СвЧ Электроники от набора параметров-критериев годноСти г. в. Чуков 2 , в. в. елесин 2 , г. н. назарова 2 , н. а. усачев 2 , д. в. бойченко 2 , а. Ю. никифоров 1 , а. в. телец 3

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