Radiation-Induced Failures for Integrated Circuits in Space and Design Philosophy

He, Yuchen; Zhao, Junkai; Juanda, Juanda; Shu, Wei; Chong, Kwen Siong; Chang, Joseph Tung-Chieh

doi:10.1109/ipfa55383.2022.9915726

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Radiation-Induced Failures for Integrated Circuits in Space and Design Philosophy

Cited by 5 publications

References 10 publications

Reliable ML-Based Image Processing and Compression for an Onboard Imaging Pipeline

Reliable ML-Based Image Processing and Compression for an Onboard Imaging Pipeline

Towards a Radiation-Tolerant Display System

A Data Pre-Processing Module for Improved-Accuracy Machine-Learning-based Micro-Single-Event-Latchup Detection

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