“…As a matter of fact, accurate phase measurements are very difficult to obtain at millimeter and sub-millimeter frequency ranges, unless expensive facilities are used. To overcome this problem, new advanced techniques have been recently developed which evaluate the far-field pattern from the knowledge of the near-field amplitude over one or more testing surfaces (Isernia et al, 1991;1996). Generally speaking, two classes of phaseless methods can be distinguished, the one based on a functional relationship within a proper set of amplitude-only data (Pierri et al, 1999), the other adopting interferometric techniques (Bennet et al, 1976).…”