2024
DOI: 10.1107/s1600576724002243
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Ray-tracing analytical absorption correction for X-ray crystallography based on tomographic reconstructions

Yishun Lu,
Ramona Duman,
James Beilsten-Edmands
et al.

Abstract: Processing of single-crystal X-ray diffraction data from area detectors can be separated into two steps. First, raw intensities are obtained by integration of the diffraction images, and then data correction and reduction are performed to determine structure-factor amplitudes and their uncertainties. The second step considers the diffraction geometry, sample illumination, decay, absorption and other effects. While absorption is only a minor effect in standard macromolecular crystallography (MX), it can become … Show more

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