Rayleigh approximation for the scattering of small partially charged sand particles

Li, Xingcai; Min, Xing; Liu, Dandan

doi:10.1364/josaa.31.001495

Cited by 16 publications

(4 citation statements)

References 18 publications

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“…Their conclusion at 10 GHz and 37 GHz are aligned with the previous results and it is confirmed that after for a constant value of charge-to-mass ratio the attenuation tend to increase with the charge distribution angle until a certain point beyond which the attenuation starts to decrease. The impact of medium properties, i.e., isotropic (having the same physical properties in all directions) or anisotropic (exhibiting distinct physical properties in different directions), on EM scattering was investigated in [130]. The simulations revealed that an anisotropic charged sphere has a greater influence than an isotropic one.…”

Section: H Influence Of Charges On Sds Attenuation Modelsmentioning

confidence: 99%

Earth and Martian Sand and Dust Storms: A Comprehensive Review of Attenuation Modelling and Measurements

Noreen,

Giannetti,

Lottici

2024

IEEE Access

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Sand and dust storms (SDS) are significant atmospheric phenomena that have a negative impact on wireless links operating at various frequencies. Specifically, sand and dust (SD) particles produce attenuation in propagating electromagnetic (EM) waves upon impact, which must be measured for the proper functioning of the fade mitigation strategy. The attenuation due to SDS can be reliably evaluated using specialized equipment. However, field experiments have been conducted in only a few locations and for a limited number of link geometries; therefore, the results are not immediately generalizable to all locations. Consequently, various attenuation models based on accessible meteorological data have been developed to provide sufficient inputs for system margin calculations under all environmental conditions. In this paper, we present a comprehensive review of an extensive set of Earth SDS attenuation models that differ based on various particle characteristics in terrestrial and space communication. Furthermore, we discuss how variables such as humidity and surface charges carried by the particles are addressed in the literature. We also provide the results of various field studies conducted in many parts of the world under diverse conditions to directly measure the influence of SDS on wireless communication systems. Dust is also a significant meteorological factor in the Martian atmosphere, where it affects the efficiency of the wireless sensor networks used by NASA's Mars Exploration Project. We explore how attenuation has been extrapolated in the Martian atmosphere. Additionally, we discuss future research challenges in SDS.INDEX TERMS Attenuation, Mie Scattering, Rayleigh Model, Sand and dust storm (SDS), Satellite communication.

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Section: H Influence Of Charges On Sds Attenuation Modelsmentioning

confidence: 99%

Earth and Martian Sand and Dust Storms: A Comprehensive Review of Attenuation Modelling and Measurements

Noreen,

Giannetti,

Lottici

2024

IEEE Access

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“…From Rayleigh scattering's point of view, the amplitude of light scattered by any deep subwavelength nanostructure with primary dimension d from a beam of unpolarized light of wavelength λ is proportional to d 3 /λ 2 [98,99]. However, the phase change φ due to a ridge with height h on a surface can be approximately expressed as φ = 4πh/λ [100], indicating that the phase is more sensitive than amplitude associated with vertical subwavelength dimensions.…”

Section: Phase-based Optical Inspection Systemsmentioning

confidence: 99%

Optical wafer defect inspection at the 10 nm technology node and beyond

Zhu¹,

Liu²,

Xu³

et al. 2022

Int. J. Extrem. Manuf.

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The growing demand for electronic devices, smart devices, and the Internet of Things constitutes the primary driving force for marching down the path of decreased critical dimension and increased circuit intricacy of integrated circuits. However, as sub-10 nm high-volume manufacturing is becoming the mainstream, there is greater awareness that defects introduced by original equipment manufacturer components impact yield and manufacturing costs. The identification, positioning, and classification of these defects, including random particles and systematic defects, are becoming more and more challenging at the 10 nm node and beyond. Very recently, the combination of conventional optical defect inspection with emerging techniques such as nanophotonics, optical vortices, computational imaging, quantitative phase imaging, and deep learning is giving the field a new possibility. Hence, it is extremely necessary to make a thorough review for disclosing new perspectives and exciting trends, on the foundation of former great reviews in the field of defect inspection methods. In this article, we give a comprehensive review of the emerging topics in the past decade with a focus on three specific areas: (1) the defect detectability evaluation, (2) the diverse optical inspection systems, and (3) the post-processing algorithms. We hope, this work can be of importance to both new entrants in the field and people who are seeking to use it in interdisciplinary work.

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“…A few attempts to treat such models appeared only recently and introduced position-dependent conductivity [24,25]. However, separation ansatz for generating function cannot be applied to obtain a complete solution of the scalar Fig.…”

Section: Consequences Of the Theoretical Modelmentioning

confidence: 99%

Optical signatures of electrically charged particles: Fundamental problems and solutions

Klačka

Kocifaj

Kundracík

et al. 2015

Journal of Quantitative Spectroscopy and Radiative Transfer

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Rayleigh approximation for the scattering of small partially charged sand particles

Cited by 16 publications

References 18 publications

Earth and Martian Sand and Dust Storms: A Comprehensive Review of Attenuation Modelling and Measurements

Earth and Martian Sand and Dust Storms: A Comprehensive Review of Attenuation Modelling and Measurements

Optical wafer defect inspection at the 10 nm technology node and beyond

Optical signatures of electrically charged particles: Fundamental problems and solutions

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