2023 35th International Conference on Microelectronic Test Structure (ICMTS) 2023
DOI: 10.1109/icmts55420.2023.10094166
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Real-time electrical measurements during laser attack on STT-MRAM

N. Yazigy
1
,
J. Postel-Pellerin
2
,
V. Della Marca
3
et al.
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