Real-Time Estimation of the Tip-Sample Interactions in Tapping Mode Atomic Force Microscopy With a Regularized Kalman Filter

Keyvani, Aliasghar; Veen, Gijs van der; Tamer, Mehmet; Sadeghian, Hamed; Goosen, J.F.L.; Keulen, Fred van

doi:10.1109/tnano.2020.2974177

Cited by 3 publications

(5 citation statements)

References 28 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The tapping mode is the most widely used imaging mode at present. [52][53][54][55] In addition to observing the surface morphology, an AFM system can also be used to study the mechanical properties of a sample. Atomic force microscopy is used to evaluate forces in the pN range (10 -12 N).…”

Section: The Basic Design and Fundamental Principle Of Afm Systemsmentioning

confidence: 99%

Research progress of single molecule force spectroscopy technology based on atomic force microscopy in polymer materials: Structure, design strategy and probe modification

Wang

et al. 2021

Nano Select

View full text Add to dashboard Cite

With the rapid development of polymer materials, the simultaneous acquisition of micro‐nano structure and mesoscopic mechanical properties from the material surface with the transverse resolution of nanoscale has become a hot spot in the research of polymer materials. Atomic force microscopy‐based high‐resolution imaging and single‐molecule force spectroscopy techniques have been widely used in various related fields. This review introduces the basic design and working principles of atomic force microscopy as well as single‐molecule force microscopy and their applications in the characterization of polymer surface morphologies, polymer film phase separation, polymer crystallization behavior, polymer chain stretching, protein folding/unfolding, G quadruplex intermolecular and intramolecular interactions, living cell surface proteins, and sugars. The research status of AFM probe modification strategies such as nanomaterial processing, single molecule manipulation and biomolecule etching is reviewed, finally, the limitations and improvement potential of single molecule force spectroscopy based on atomic force microscopy (AFM‐ SMFS) are summarized and discussed, and the new research practice in the field of polymer materials is prospected.

show abstract

Section: The Basic Design and Fundamental Principle Of Afm Systemsmentioning

confidence: 99%

Research progress of single molecule force spectroscopy technology based on atomic force microscopy in polymer materials: Structure, design strategy and probe modification

Wang

et al. 2021

Nano Select

View full text Add to dashboard Cite

show abstract

“…In recent years, more and more control and communication theories such as Kalman filter [21] have been applied for amplitude-modulation AFM to realize amplitude demodulation [22,23], but there are few applications for demodulation in FM-AFM. In this article, a novel amplitude and frequency demodulation algorithm for FM-AFM is proposed.…”

Section: Introductionmentioning

confidence: 99%

A novel amplitude and frequency demodulation algorithm for frequency-modulation atomic force microscope

Wang¹,

Li²,

Rui-chao³

et al. 2021

Meas. Sci. Technol.

View full text Add to dashboard Cite

Frequency-modulation atomic force microscope (FM-AFM) has been a widely-used instrument to achieve atomic or subatomic resolution imaging. However, the low bandwidth of automatic gain control circuit for amplitude control loop and the low setting rate of frequency demodulation loop have been a big stumbling block for FM-AFM to realize fast measurement. In this article, a novel demodulation algorithm for FM-AFM is proposed. The Kalman filter approach is proposed to realize amplitude demodulation, and the FM signal is processed as a phase modulation signal (indirect FM signal). The performance of the algorithm is verified through experiment on field-programmable gate array, and compared with existing methods. Through the proposed method, the tracking performance of FM-AFM can be improved and the response rate can be increased without loss of precision.

show abstract

“…More approaches for recovering the t/s-interaction in HS-AFM have been developed in [12], [13], [14], [15]. In contrast to the former two methods [12], [13], Karvinen et al [14] employ the impulsive nature of the interaction, making the recovery less sensitive to noise.…”

mentioning

confidence: 99%

“…Nevertheless, the assumptions in [14] involving fixed time instances of pulses is too restrictive. In [15], (semi-)periodicity of t/s-interaction is still assumed, requiring a cumbersome system augmentation involving a priori modelling of a chosen number of harmonics above the noise level.…”

mentioning

confidence: 99%

“…As the signal z cannot be measured, a model for the z-piezo is used to form an estimate ẑ, which can be used for the two new methods for estimating the sample height h with ĥ. is made that the t/s-interaction is pulse-like. As opposed to [14], [15] where the idea was to use the estimated t/s-interaction as input for the controller, our final goal is to estimate the sample height as accurate as possible. After applying an equivalent extension for reconstructing the sample height to the method in [14], the results will be compared.…”

mentioning

confidence: 99%

See 1 more Smart Citation

High-Speed Tapping Mode AFM Utilizing Recovery of Tip-Sample Interaction

Noom

Smith

Verbiest

et al. 2023

IEEE Trans. Nanotechnology

View full text Add to dashboard Cite

We propose to use the State Estimation by Sum-of-Norms Regularisation (STATESON-)algorithm for recovering the tip-sample interaction in high-speed tapping mode atomic force microscopy (AFM). This approach enables accurate sample height estimation for each independent cantilever oscillation period, provided that the tip-sample interaction dominates the noise. The entire course of the cantilever deflection signal is compared to a modelled counterpart in subsequent convex minimisations, such that the sparse tip-sample interaction can be recovered. Afterwards, the sample height is determined using the minimum smoothed cantilever deflection per cantilever oscillation period. Results from simulation experiments are in favour of the proposed approach as it consistently reveals sharp edges in sample height, as opposed to both the conventional and a closely related existing approach. However, the non-processed cantilever deflection provided most accurate sample height estimation. It is recommended to implement the STATESON-algorithm in the form of a filter to use it in feedback control of the scanner and cantilever excitation.

show abstract

Real-Time Estimation of the Tip-Sample Interactions in Tapping Mode Atomic Force Microscopy With a Regularized Kalman Filter

Cited by 3 publications

References 28 publications

Research progress of single molecule force spectroscopy technology based on atomic force microscopy in polymer materials: Structure, design strategy and probe modification

Research progress of single molecule force spectroscopy technology based on atomic force microscopy in polymer materials: Structure, design strategy and probe modification

A novel amplitude and frequency demodulation algorithm for frequency-modulation atomic force microscope

High-Speed Tapping Mode AFM Utilizing Recovery of Tip-Sample Interaction

Contact Info

Product

Resources

About