Recent developments in IBA analysis at CENTA, Bratislava

Abstract

An experimental setup used at the CENTA (Centre for Nuclear and Accelerator Technologies) laboratory to carry out IBA (Ion Beam Analysis) techniques is described. PIXE (Particle Induced X-ray Emission) technique offers a unique way of non-destructive elemental analysis using accelerated ion beams. The calibration of instrumental constants (H-values) of SDD and BEGe detectors, used in the setup, is described in detail. The H-value was determined as a function of X-ray energy by using thin MicroMatter standards of chosen elements. The calibrated H-values were then used in GUPIXWIN for the determination of elemental concentrations in two IAEA reference materials, which were compared with reference values. A reasonable agreement was achieved between the measured and reference values, while the calibrated H-values will be used for further analyses.