1950
DOI: 10.1051/anphys/195012050706
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Recherches sur la propagation des ondes électromagnétiques sinusoïdales dans les milieux stratifiés

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Cited by 211 publications
(183 citation statements)
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“…For a multiple-layer stack, Maxwell's equations are conventionally implemented using a matrix formulation such as first provided by Abeles, 1 and further developed by Yeh. [2][3][4] The Snell invariant is born from the continuity of the field components along each interface.…”
Section: Introductionmentioning
confidence: 99%
“…For a multiple-layer stack, Maxwell's equations are conventionally implemented using a matrix formulation such as first provided by Abeles, 1 and further developed by Yeh. [2][3][4] The Snell invariant is born from the continuity of the field components along each interface.…”
Section: Introductionmentioning
confidence: 99%
“…And therefore the energy coefficients of the glazing system, from (4) can be written as, † It can be noted that this result is also obtained within the characteristic matrix theory, as shown by Abelès (1950), Theorem I: "The transmission factor of any stratified medium (absorbing or not) is independent of the sense of wave propagation". The proof of this theorem is made by induction, by showing that the product of characteristic matrices, ordered from front to back and vice versa, always has the same diagonal elements.…”
Section: General Solution For Laminated Glass With Internal and Extermentioning
confidence: 72%
“…Transfer matrix methods have been largely studied in the literature from different approaches (Centurioni 2005 These methods have their roots in the classical study of characteristic matrices (dependent on Fresnel coefficients for interference systems or coherent case) which connect the electromagnetic field components at an interface (Abelès 1950, Born and Wolf 1959, Heavens 1960 and the application of the method to thin films (Epstein 1952, Francombe and Hoffman 1971, Herpin 1947, Thelen 1989. The reformulation of these matrices in terms of coefficients relating energy magnitudes (through, e.g., the Poynting vector) allows the definition of transfer matrices as proposed herein.…”
Section: Introductionmentioning
confidence: 99%
“…Table 2 shows refractive indexes and film thicknesses of (PDDA/SiO 2 ) 8, (PDDA/TALH) 20 and (PDDA/Na 2 SiO 3 ) 40 coated on silicon wafer measured by 632.5 nm of incident light wavelength were estimated by ellipsometer [21,22]. On the other hand, the calculated value of the refractive index and film thickness obtaied from the equations (1) to (5) was shown in Table 3.…”
Section: Self-assembled Nano Heterostructural Antireflection Filmmentioning
confidence: 99%