2020
DOI: 10.1088/1361-6501/ab5cb1
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Reconstruction of multi-frame semi-sparse scanning probe microscopy images using dependent Gaussian process

Abstract: A major drawback of scanning probe microscopes (SPMs) is the time-consuming image acquisition, typically on the order of tens of seconds to minutes. Sparse raster scanning and non-raster scanning have been demonstrated to be effective approaches to improve the efficiency of SPMs. However, these strategies entail the challenge of reconstructing accurate images from semi-sparse sampling points, which means the distribution of the scattered sampling points is considerably sparser in the direction perpendicular to… Show more

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Cited by 3 publications
(1 citation statement)
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“…This technique involves a scanning pattern that either bypasses high-frequency signals [11][12][13][14][15][16][17][18] or reduces scanning points, followed by image reconstruction through software. [19][20][21][22][23][24] Its advantages include fewer surface scans, reduced scanning time, and a shorter total measurement duration. Under-sampled SPM allows a short time for SPM measurements, but it is necessary to evaluate whether the data acquisition and reconstruction are performed correctly because the data at unacquired positions are compensated for by estimated values.…”
Section: Introductionmentioning
confidence: 99%
“…This technique involves a scanning pattern that either bypasses high-frequency signals [11][12][13][14][15][16][17][18] or reduces scanning points, followed by image reconstruction through software. [19][20][21][22][23][24] Its advantages include fewer surface scans, reduced scanning time, and a shorter total measurement duration. Under-sampled SPM allows a short time for SPM measurements, but it is necessary to evaluate whether the data acquisition and reconstruction are performed correctly because the data at unacquired positions are compensated for by estimated values.…”
Section: Introductionmentioning
confidence: 99%