Reduce Yield Loss in Delay Defect Detection in Slack Interval

Abstract

1 A new delay-testing scheme that identifies abnormal delays in the slack interval by comparing switching delays in neighboring dies on a wafer has been recently proposed and validated on experimental circuits. The simulation showed orders of magnitude delay defect detection efficiency improvement. In this paper we investigated the yield loss problem and proposed a practical production test based on delay defect detection in slack interval (DDSI).