Reflection efficiency and spectra resolutions ray-tracing simulations for the VOXES HAPG crystal based Von Hamos spectrometer

Abstract

The VOXES collaboration at INFN National Laboratories of Frascati developed a prototype of a high resolution Von Hamos X-ray spectrometer using HAPG (Highly Annealed Pyrolytic Graphite) mosaic crystals. This technology allows the employment of extended isotropic sources and could find application in several physics fields. The capability of the spectrometer to reach energy precision and resolution below 1 and 10 eV, respectively, when used with wide sources have been already demonstrated. Recently, the response of this device, for a ρ = 206.7 mm cylindrically bent HAPG crystal using CuKα 1,2 and F eKα 1,2 XRF lines, has been investigated in terms of reflection efficiency by a dedicated ray-tracing simulation. Details of the simulation procedure and the comparison with the experimental results are presented. This study is crucial in order to retrieve information on the spectrometer signal collection efficiency, especially in the energy range in which the standard calibration procedures cannot be applied.

HAPG mosaic crystal Von Hamos spectrometer for high precision kaonic atoms spectroscopy

“…In order to evaluate the possibility to measure kaonic transitions with our spectrometer, we performed X-ray tracing simulations using the XOPPY-SHADOW ray tracing simulation softwares embedded in the OASYS framework and checked the consitency of their outcomes with our measurements both in terms of spectral resolutions and of reflections efficiencies of the apparatus, which have been already published in [9,10]. In Fig.…”