Reliability Modeling and Analysis of Clockless Wave Pipeline Core for Embedded Combinational Logic Design

Feng, Tao; Park, Noh-Jin; Choi, Minsu; Park, Nohpill

doi:10.1109/tim.2009.2030917

IEEE Trans. Instrum. Meas.

2010

DOI: 10.1109/tim.2009.2030917

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Reliability Modeling and Analysis of Clockless Wave Pipeline Core for Embedded Combinational Logic Design

Tao Feng

Noh-Jin Park

Minsu Choi

et al.

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Reliability Modeling and Analysis of Clockless Wave Pipeline Core for Embedded Combinational Logic Design

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