Nanoelectronics 2017
DOI: 10.1002/9783527800728.ch13
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Reliability of Nanoelectronic Devices

A. S. Oates
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Kin P. Cheung
2
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Cited by 4 publications
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References 21 publications
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Circuit reliability prediction based on deep autoencoder network

Xiao
1
,
Ma
2
,
Lou
3
et al. 2019
Neurocomputing
8
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Circuit reliability prediction based on deep autoencoder network

Xiao
1
,
Ma
2
,
Lou
3
et al. 2019
Neurocomputing
8
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A Stochastic-Based Reliability Calculation Method for RTL Circuits

Xiao
1
,
Ji
2
,
Lou
3
et al. 2020
2020 International Conferences on Internet of Things (iThings) and IEEE Green Computing and Communications (GreenCom) and IEEE
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Identifying Reliability-Critical Primary Inputs of Combinational Circuits Based on the Model of Gate-Sensitive Attributes

Xiao
1
,
Chen
2
,
Lou
3
et al. 2022
IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.
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