2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) 2024
DOI: 10.1109/ipemc-ecceasia60879.2024.10567721
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Reliability under High Gate-Voltage Condition on SiC MOSFET Through Repeated Overcurrent

Keiji Wada,
Takahide Sagae,
Shin-Ichiro Hayashi
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