Research on digital integrated circuit testing technology under Internet of Things technology

Abstract

Aiming at the problem of poor test accuracy of digital integrated circuits at present, this paper puts forward the research on digital integrated circuit test technology under the Internet of things technology, realizes circuit information collection and analysis through analog digital integrated circuit faults, and constructs an abnormal data identification algorithm of digital integrated circuits combined with the Internet of things technology. Finally, it is confirmed by experiments, under the Internet of things technology, digital integrated circuit test technology has high practicability in the process of practical application, which can effectively solve the problem of insufficient test accuracy of digital integrated circuit and fully meet the research requirements.