Research on Integrated Circuit Packaging Testing Technology Based on Large Language Model

Li, Qiang; Ma, Xinqiang; Yan, Meng

doi:10.1109/isset62871.2024.10779952

2024 3rd International Symposium on Semiconductor and Electronic Technology (ISSET) 2024

DOI: 10.1109/isset62871.2024.10779952

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Research on Integrated Circuit Packaging Testing Technology Based on Large Language Model

Qiang Li,

Xinqiang Ma,

Meng Yan

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Research on Integrated Circuit Packaging Testing Technology Based on Large Language Model

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