Research on RF Voltage Measurement Method of Chip Pins
Abstract:As the core device of electronic equipment, integrated circuit (IC) usually produces large highfrequency electromagnetic interference. In order to study the generation mechanism and suppression methods of such noise, accurate noise measurement and extraction must be carried out. At present, the measurement standard of chip level electromagnetic compatibility is not perfect, and the high-frequency characteristics of pin noise are difficult to be measured accurately. In order to achieve accurate chip pin RF volt… Show more
Set email alert for when this publication receives citations?
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.