2022
DOI: 10.1109/tia.2022.3193908
|View full text |Cite
|
Sign up to set email alerts
|

Research on VFTO Simulation Analysis of 1000 kV GIS Test Circuit Considering Dynamic Arcing Model

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
2
2
1

Relationship

0
5

Authors

Journals

citations
Cited by 9 publications
(1 citation statement)
references
References 10 publications
0
1
0
Order By: Relevance
“…VFTO is generated during the operation of circuit breakers and disconnectors within GIS. It has a very short rise time in the range of 4 to 100 ns, and high-frequency oscillations in the range of a few hundred kilohertz to about a few tens of megahertz [10][11] . VFTO not only causes stress on the internal insulation of the GIS and the primary pieces of equipment but also causes stress on the secondary pieces of equipment and overvoltage across adjacent pieces of equipment.…”
Section: Introductionmentioning
confidence: 99%
“…VFTO is generated during the operation of circuit breakers and disconnectors within GIS. It has a very short rise time in the range of 4 to 100 ns, and high-frequency oscillations in the range of a few hundred kilohertz to about a few tens of megahertz [10][11] . VFTO not only causes stress on the internal insulation of the GIS and the primary pieces of equipment but also causes stress on the secondary pieces of equipment and overvoltage across adjacent pieces of equipment.…”
Section: Introductionmentioning
confidence: 99%