Resistivity measurements of layered metallic films at various microwave frequencies and temperatures using the micro-strip T-junction method

Abstract

The frequency and temperature dependence of the surface resistance of metallic films was measured by a microwave micro-strip method under a T-junction structure. Numerical analysis of micro-strips made of silver-tin (Ag-Sn) alloy, or good conducting niobium (Nb) films reveals the surface resistances behaving as nearly a one-half power law dependence on the frequency, which is in congruence with the results derived from the free-electron model in simple metals. In addition, we have specifically investigated the electron transport with a strong localization effect on the DC temperature-dependent resistivity in abnormal and normal Nb films. The results indicate a deviation from a one-half power law may occur in the abnormal film. This work can be further exploited to measure the conductivity and penetration depth of metals in multilayered structure or of superconducting films.

Measurement of dielectric constants of metallic nanoparticles by a microwave dielectric resonator

“…An Anritsu 37347A network analyser is implemented to measure the S 21 transmission signal. The selection of the TE 011 mode is identified providing that the intensity of one of the S 21 spectrum lines is kept constant when the intersection angles between the input and output coupling antennas are varied [17][18][19]. The unloaded Q factor and resonant frequency of the empty DR determines the dielectric constant of the sapphire ring as ε = 9.73 which is slightly larger than the value along the ab-plane and smaller than its value along the c-axis presuming the DR z-axis is inclined to the crystalline c-axis.…”

Accelerated Testing and Reliability of FDM-Based Structural Electronics

“…The main component of the conductive material was silver micro powder, while the resistor pads were plated with tin base alloy (which was confirmed in energy-dispersive X-ray spectroscopy). These two metals can form alloys with resistivity of up to two orders of magnitude higher than that of pure silver, which was observed while developing Ag-based resistors [33] and microelectronics films [34]. Furthermore, diffusion at the junction of these two metals was observed below the soldering temperature, and the resistivity of such a junction increases in time at an exponential rate [35], which is important for long-term processes.…”

Coexistence of ferromagnetic resonance and microstrip resonance for nickel films under magnetic fields

“…Microwave techniques allow high-sensitivity measurement of the dependence of the conductivity of thin magnetic films on temperature [1][2][3] and magnetic field [4][5][6]. The large demand from communication and video applications [7] also suggests to us the need to expand the use of monolithic microwave microstrip circuits.…”