Resonances in a single thin dielectric layer: enhancement of the Goos - Hänchen shift

Kaiser, Robin; Lévy, Yves; Fleming, John C.; Muniz, Sérgio Ricardo; Bagnato, Vanderlei Salvador

doi:10.1088/0963-9659/5/6/015

Cited by 27 publications

(8 citation statements)

References 14 publications

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“…If the incident angle inside the substrate is correctly chosen to obtain refraction on the substrate-layer interface and total reflection on the layer-air interface, some resonance could appear on the GH shift for a discrete series of specific angles. 10 This behavior has already been investigated because it represents interesting opportunities to make atomic mirrors 11 or optical sensors. The present paper is devoted to a full reinvestigation of the interesting properties of such guiding structure with our original experimental setup.…”

Section: Introductionmentioning

confidence: 99%

Goos-Hänchen and Imbert-Fedorov shifts for leaky guided modes

et al. 2005

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The Goos-Hänchen shift for a light beam totally reflected on the external interface of a dielectric thin film deposited on a high-index substrate can be strongly enhanced through some specific incidence angles corresponding to the leaky guided modes into the layer. Because the resonant eigenstates are polarization dependent, it has been possible to observe such resonance with an experimental setup based on a periodic modulation of the polarization state combined with position-sensitive detection. Classical models usually used for a single interface (Artmann's model based on phase argument and Renard's model based on an energetic interpretation) have been re-adapted to describe the behavior of the entire layer. Good agreement is obtained between theory and experimental results.

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Section: Introductionmentioning

confidence: 99%

Goos-Hänchen and Imbert-Fedorov shifts for leaky guided modes

et al. 2005

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“…Though the discussion here is concerned only with total reflection at single dielectric interfaces, it is also relevant to total reflection in structures containing dielectric [13][14][15] or metallic 16 thin film. When one investigates the GH displacement in experiments, as has been done in the literature, 5,16,26 one will accidentally measure a value at about the critical angle or at grazing incidence.…”

Section: Discussionmentioning

confidence: 99%

“…6,7 The investigation of GH displacement has been extended into total reflections at surfaces of absorptive media, 8,9 nonlinear media, 10,11 and negatively refractive media. 12 Recently, it was reported that the GH displacement can be greatly enhanced by a dielectric thin film [13][14][15] or a metallic thin film 16 at resonances. Due to its special role in optical tunnelling, 17 the GH displacement is closely related to the so-called superluminal phenomenon [18][19][20] in the frustrated-total-internal-reflection configuration.…”

Section: Introductionmentioning

confidence: 99%

Theory of the Goos-Hänchen Displacement in Total Internal Reflection

Shi

Wang

2007

Int. J. Mod. Phys. B

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Since the Goos-Hänchen (GH) effect is the displacement of the totally reflected beam at a dielectric interface from the position prediction by geometrical reflection, the concept of GH displacement is applicable only when the reflected beam retains the shape of the geometrically reflected or incident beam. The necessary and sufficient condition has been advanced for the totally reflected beam to retain the shape of the incident beam. Numerical simulations have been performed to confirm this condition. It has been shown that the GH displacement results from the mechanism of beam reshaping due to the linear dependence of the reflection phase shift upon the parallel component of the wave vector, in the interval in which the angular spectral distribution function of the incident beam is appreciable.

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“…An important extension of the original focus on centroid shifts at a single interface is to consider three-layer systems in which two interfaces are separated by a distance, L, as shown in Figure 1. For instance, Kaiser et al 26 used linearly polarized beams with no OAM to experimentally measure the GH shift that occurs when light travels through glass and is totally reflected at a thin film A c c e p t e d M a n u s c r i p t with a lower refractive index. It was discovered that there are angles of incidence for which the GH effect is significantly enhanced.…”

Section: Introductionmentioning

confidence: 99%

Large centroid shifts of vortex beams reflected from multi-layers

Lusk¹,

Siemens²,

Quinteiro³

2018

J. Opt.

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Gaussian beams reflected from a multi-layered dielectric experience a shift in their centroid that is different than that from a single interface. This has been previously investigated for linearly polarized beams and, to a much lesser extent, beams with spin angular momentum. Here a combination of theoretical and computational analysis is used to provide a unified quantification of these shifts in layered dielectrics, for light endowed with an intrinsic orbital angular momentum-i.e. vortex beams. Two geometries are considered: air/glass/air and glass/air/glass multi-layers. Destructive interference causes singular lateral shifts in the centroid of the reflected vortex beam for which spin alone produces only a mild modulation. In the case of total internal reflection, both spin and intrinsic orbital angular momentum contribute to an enhancement of these lateral shifts as the interlayer thickness is decreased. This is just the opposite of the trend associated with longitudinal shifts. We find that vortex beams undergo centroid shifts up to tens of microns, more than an order of magnitude larger than for Gaussian beams.

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Resonances in a single thin dielectric layer: enhancement of the Goos - Hänchen shift

Cited by 27 publications

References 14 publications

Goos-Hänchen and Imbert-Fedorov shifts for leaky guided modes

Goos-Hänchen and Imbert-Fedorov shifts for leaky guided modes

Theory of the Goos-Hänchen Displacement in Total Internal Reflection

Large centroid shifts of vortex beams reflected from multi-layers

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